Prazo para submissão: 15 January 2025
Data de Notificação: 01/04/2025
Editora: Elsevier
Revista: Microprocessors and Microsystems
Detalhes:
Defect and fault tolerance in VLSI and nanotechnology systems including emerging technologies, RISC-V architectures and AI-based solutions, are pervasive topics spanning domains and applications. This special issue features both new academic research and state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, availability, and security that are affected by defects during manufacturing and by faults d