Prazo para submissão: 31 January 2025
Data de Notificação: 01/04/2025
Editora: Elsevier
Revista: Microelectronic Engineering
Detalhes:
The high performance of microelectronic devices stands as the cornerstone for the long-lasting and fault-free operation of intricate electrical circuits in their diverse applications. While significant strides have enhanced the performance and structure of integrated semiconductor devices in recent decades, persistent challenges continue which affect the robust operation of transistors and circuits. For example, modern MOS transistors suffer from imperfections at the atomic level, which evolve a