Prazo para submissão: 15 November 2024
Data de Notificação: 01/04/2025
Editora: Elsevier
Revista: Microelectronics Reliability
Detalhes:
This special issue of Microelectronics and Reliability comprises a selection of papers presented during the 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2024, at Parma (Italy) from September 23rd to 26th, 2024. This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for