Prazo para submissão: 31 January 2025
Data de Notificação: 01/04/2025
Editora: Elsevier
Revista: Microelectronic Engineering
Detalhes:
Research and development in the fields of integrated circuits reliability and failure analysis are critical to the growth and progress of semiconductor industry. The International Symposium on the Physical and Failure Analysis of Integrated (IPFA) is a well-established premier venue for experts in these fields to present their latest findings and address upcoming challenges. First held in 1985, the 31stedition was hosted in Singapore in July 2024. This special issue will offer extended versions